The lateral resolution archived by Raman microscopy, as well as any conventional optical system, is diffraction limited to roughly half of the incident light wavelength. This means a resolution of few hundreds of nanometers when visible light is used as incident radiation, which is insufficient for resolving and properly characterize the morphology of any nanostructure. In such an optical system, the range of long wavevectors of the scattered optical components are lost at only few nanometers far from the sample as evanescent waves, limiting the detected optical information from the far-field and the archivable spatial resolution. As a way to go beyond this barrier, Tip Enhanced Raman Spectroscopy (TERS) combines the Raman spectroscopy system with a scanning probe microscope, which holds an optical nanoantenna few nanometers from the sample. The nanoantenna is designed to convert the propagation optical radiation into localized energy, and vice-versa, allowing Raman spectroscopy to perform with spatial resolution down to 10 nm. In this talk I will present and discuss the fundamental of TERS focusing on the development of new efficient optical nanoantennas made by Inmetro and UFMG. Also, I will give examples of applications of TERS in the characterization of two-dimensional materials and other nanomaterials, including our work recently published in Nature on the TERS characterization of low-angle twisted bilayer graphene.